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September 12, 2012

Aeroflex Adds 7700 Integrated Microwave Test System to its Synthetic Instrument Portfolio



By Mandira Srivastava
TMCnet Contributor



Aeroflex (News - Alert) Incoporated, a wholly-owned subsidiary of Aeroflex Holding Corp., has added a new instrument for integrated microwave testing. Designed for accelerated production testing of microwave and RF components and modules, the 7700 is an ATE (Automated Test Equipment) system-in-a-box.

Based on Aeroflex’s synthetic architecture and Common Platform hardware, the 7700 is a bench-sized instrument providing fast measurement throughput.

“The 7700 is designed to reduce the cost of production test by eliminating multiple test instruments, ATE development cost, and ongoing maintenance,” said Keith Andrews, product manager for synthetic instruments, Aeroflex. “Over time, configuration, software and maintenance costs are usually much greater than the initial hardware investment.”

7700 comes with the dimensions of a bench instrument. The Aeroflex Measurement Using Console Test Executive holds that all aspects of the production test process can be controlled, including the DUT (Device Under Test), remote switching hardware, thermal chambers and more. Using production test sequences provided by the base model, the 7700 provides the functionality and measurements of a vector signal generator, spectrum analyzer, vector network analyzer, oscilloscope, power meter, frequency counter, noise figure meter and a phase noise analyzer.

The 7700’s tight coupling of signal generation, measurements and DUT control increases measurement throughput significantly over traditional rack-mounted ATE systems.

 “Customers achieved up to 4X faster throughput using Aeroflex synthetic instruments. We’ve spent many years perfecting our architecture and unique test executive to save customers hundreds of hours writing software and configuring ATE systems,” said Andrews. “The 7700 is quickly configured and redeployed. There’s no need to build a new test system for each new DUT. Customers can test an L-band component in the morning and an S-band module the same afternoon.”

The 7700 Integrated Microwave Test System has a frequency range of 1 MHz to 6 GHz, with options up to 32 GHz. It includes a complete measurement suite including S-parameters for full characterization of devices such as low noise amplifiers (LNA), variable crystal oscillators (VCO), and transceiver modules.

Key traits of the 7700 include 90 MHz RF modulation bandwidth, under 1 ms of frequency switching times, 115 dBm (News - Alert) phase noise (2 GHz, 20 kHz offset), less than -120 dBm of residual noise floor, and more than 100 dB dynamic range. 

Want to learn more about the latest in communications and technology? Then be sure to attend ITEXPO West 2012, taking place Oct. 2-5, in Austin, TX. Stay in touch with everything happening at ITEXPO (News - Alert). Follow us on Twitter.




Edited by Braden Becker
 
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